VLSI SoC Design: Concepts, Perspective & Implementation
why coverage is more in stuck at than transition fault ?
This comment has been removed by the author.
Stuck at fault testing will generate dominant Combinatoric ATPG patterns whereas transition fault testing will be more of sequential type ATPG when you use two capture pulses.
why coverage is more in stuck at than transition fault ?
ReplyDeleteThis comment has been removed by the author.
DeleteStuck at fault testing will generate dominant Combinatoric ATPG patterns whereas transition fault testing will be more of sequential type ATPG when you use two capture pulses.
Delete